25/10/2019 – Report on the N-vN device simulation methods

FEM model geometry, unit cell

Among the research activities carried out for the Fun-COMP project, the simulation methodology is an invaluable tool to move steps towards a better understanding of the devices mechanisms and behaviour.

Simulation, or modeling, usually consists of the mathematical replica of a device, over which the known laws of physics are applied, and whose results are tested against the experimental data. The general purpose is dual: expand the knowledge over the physical mechanisms and material properties governing the device behaviour, and use this knowledge to infer any possible improvement without the immediate need of an experimental exploration.

Indeed, simulation is quite a broad term, encasing several different approaches and aims. For the Fun-COMP research we developed several different methodologies, two of these dedicated to tackle only the unit cell behavior. One is the Finite Element model, defined to explore and test the unit cell physical laws, and the second one is the Behavioral model, employed to predict larger scales integration.

Further information on the simulation methods is contained in this report.